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High brilliance, metrology x-ray sources for the soft and tender x-ray range
Metrology, Inspection, and Process Control XL · Christoph Rose-Petruck
in OpenAlex
on Scholar
noneScholar citations
0OpenAlex citations
From the CV
Not in the CV.
- DOI
- 10.1117/12.3090193
- OpenAlex
- W7130731526
Where each field came from
| Field | CV | OpenAlex | Scholar |
|---|---|---|---|
| title | High brilliance, metrology x-ray sources for the soft and tender x-ray range (used) | High brilliance, metrology x-ray sources for the soft and tender x-ray range | |
| year | 2026 (used) | 2026 | |
| venue | Metrology, Inspection, and Process Control XL (used) | ||
| kind | other | other (used) | |
| DOI | 10.1117/12.3090193 (used) | ||
| first author | Yamaguchi (used) | Yamaguchi |
The value in bold is the one the record uses.
How the records were joined
- fingerprint merged · 1.00 · Run 18