Journal
Materials Science in Semiconductor Processing
ISSN 1369-8001 · Elsevier BV
Published here
2 counted works of 2 linked
| Year | Title | Academics | Sources |
|---|---|---|---|
| 2006 | E-MRS Symposium L: Characterization of high-k dielectric materials | Kosuke Imai | GS |
| 2006 | Performance improvement of CMOS device utilizing poly-Si/HfSiON gate stack and its reliability concern for 65 nm technology and beyond | Kosuke Imai | GS |